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Proceedings Paper

Predicting fiber refractive index from a measured preform index profile
Author(s): P. Kiiveri; J. Koponen; J. Harra; S. Novotny; H. Husu; H. Ihalainen; T. Kokki; V. Aallos; O. Kimmelma; J. Paul
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Paper Abstract

When producing fiber lasers and amplifiers, silica glass compositions consisting of three to six different materials are needed. Due to the varying needs of different applications, substantial number of different glass compositions are used in the active fiber structures. Often it is not possible to find material parameters for theoretical models to estimate thermal and mechanical properties of those glass compositions. This makes it challenging to predict accurately fiber core refractive index values, even if the preform index profile is measured. Usually the desired fiber refractive index value is achieved experimentally, which is expensive. To overcome this problem, we analyzed statistically the changes between the measured preform and fiber index values. We searched for correlations that would help to predict the Δn-value change from preform to fiber in a situation where we don’t know the values of the glass material parameters that define the change. Our index change models were built using the data collected from preforms and fibers made by the Direct Nanoparticle Deposition (DND) technology.

Paper Details

Date Published: 20 February 2018
PDF: 6 pages
Proc. SPIE 10513, Components and Packaging for Laser Systems IV, 105131F (20 February 2018); doi: 10.1117/12.2285815
Show Author Affiliations
P. Kiiveri, nLIGHT Oy, Lohja (Finland)
J. Koponen, nLIGHT Oy, Lohja (Finland)
J. Harra, nLIGHT Oy, Lohja (Finland)
S. Novotny, nLIGHT Oy, Lohja (Finland)
H. Husu, nLIGHT Oy, Lohja (Finland)
H. Ihalainen, nLIGHT Oy, Lohja (Finland)
T. Kokki, nLIGHT Oy, Lohja (Finland)
V. Aallos, nLIGHT Oy, Lohja (Finland)
O. Kimmelma, nLIGHT Oy, Lohja (Finland)
J. Paul, nLIGHT Oy, Lohja (Finland)


Published in SPIE Proceedings Vol. 10513:
Components and Packaging for Laser Systems IV
Alexei L. Glebov; Paul O. Leisher, Editor(s)

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