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Proceedings Paper

Mesoscale 2D/3D cloud-resolving models with explicit microphysics and radiation as a tool for analysis and interpretation of remote sensing and in-situ measurements
Author(s): Vitaly I. Khvorostyanov
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Paper Abstract

Presented in this report are mesoscale 2DT and 3DT cloud models with explicit microphysics developed by the author and suitable for simulation of various cloud types (Khvorostyanov, 1995). The models are based on two kinetic equations for droplet and crystal size distribution functions with division of droplet and crystal size spectra into 30 bins from 1 micrometer to 3.5 mm and with detailed account for CCN and ice nuclei activation, condensation/deposition and coalescence/accretion growth. These equations are being solved along with supersaturation equation and with radiative transfer equations. Simple but accurate analytical expressions are derived for scattering and absorption coefficients and single-scattering albedo. This allows us to make detailed calculations of the optical and radiative characteristics of clouds (fluxes, divergence, albedo) at each gridpoint of the computational domain with account for their time evolution along with evolving cloud microstructure and phase state. Two examples are considered here: (1) development of Ci clouds (2D model); (2) seeding from a contrails into underlying liquid As cloud (3D model). Cloud microphysics and interaction with longwave and solar radiation are described along with characteristics which can be measured by means of remote sensing: radiative fluxes, albedo and emissivity for various satellite channels, radar reflectivity. Such information can be used for planning and analysis of field experiments.

Paper Details

Date Published: 15 December 1995
PDF: 16 pages
Proc. SPIE 2582, Atmospheric Sensing and Modeling II, (15 December 1995); doi: 10.1117/12.228554
Show Author Affiliations
Vitaly I. Khvorostyanov, Univ. des Sciences et Technologies de Lille (United States)


Published in SPIE Proceedings Vol. 2582:
Atmospheric Sensing and Modeling II
Richard P. Santer, Editor(s)

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