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Proceedings Paper

High-resolution optical polarimetric elastography for measuring the mechanical properties of tissue
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Paper Abstract

Traditionally, chemical and molecular markers have been the predominate method in diagnostics. Recently, alternate methods of determining tissue and disease characteristics have been proposed based on testing the mechanical behavior of biomaterials. Existing methods for performing elastography measurements, such as atomic force microscopy, compression testing, and ultrasound elastography, require either extensive sample processing or have poor resolution. In the present work, we demonstrate an optical polarimetric elastography device to characterize the mechanical properties of salmon skeletal muscle. A fiber-coupled 1550nm laser paired with an optical polarizer is used to create a fiber optic sensing region. By measuring the change in polarization from the initial state to the final state within the fiber sensing region with a polarimeter, the loading-unloading curves can be determined for the biomaterial. The device is used to characterize the difference between samples with a range of collagen membranes. The loading-unloading curves are used to determine the change in polarization phase and energy loss of the samples at 10%, 20% and 30% strain. As expected, the energy loss is a better metric for measuring the mechanical properties of the tissues because it incorporates the entire loading-unloading curve rather than a single point. Using this metric, it is demonstrated the device can repeatedly differentiate between the different membrane configurations.

Paper Details

Date Published: 19 February 2018
PDF: 6 pages
Proc. SPIE 10496, Optical Elastography and Tissue Biomechanics V, 1049606 (19 February 2018); doi: 10.1117/12.2285443
Show Author Affiliations
Alexa W. Hudnut, The Univ. of Southern California (United States)
Andrea M. Armani, The Univ. of Southern California (United States)


Published in SPIE Proceedings Vol. 10496:
Optical Elastography and Tissue Biomechanics V
Kirill V. Larin; David D. Sampson, Editor(s)

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