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Proceedings Paper

Digital Moiré based transient interferometry and its application in optical surface measurement
Author(s): Qun Hao; Yifeng Tan; Shaopu Wang; Yao Hu
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Paper Abstract

Digital Moiré based transient interferometry (DMTI) is an effective non-contact testing methods for optical surfaces. In DMTI system, only one frame of real interferogram is experimentally captured for the transient measurement of the surface under test (SUT). When combined with partial compensation interferometry (PCI), DMTI is especially appropriate for the measurement of aspheres with large apertures, large asphericity or different surface parameters. Residual wavefront is allowed in PCI, so the same partial compensator can be applied to the detection of multiple SUTs. Excessive residual wavefront aberration results in spectrum aliasing, and the dynamic range of DMTI is limited. In order to solve this problem, a method based on wavelet transform is proposed to extract phase from the fringe pattern with spectrum aliasing. Results of simulation demonstrate the validity of this method. The dynamic range of Digital Moiré technology is effectively expanded, which makes DMTI prospective in surface figure error measurement for intelligent fabrication of aspheric surfaces.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 104581E (24 October 2017); doi: 10.1117/12.2285354
Show Author Affiliations
Qun Hao, Beijing Institute of Technology (China)
Yifeng Tan, Beijing Institute of Technology (China)
Shaopu Wang, Beijing Institute of Technology (China)
Yao Hu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 10458:
AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
Wolfgang Osten; Anand Krishna Asundi; Huijie Zhao, Editor(s)

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