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Proceedings Paper

Research on characteristics measurement of infrared defect tester
Author(s): Ke-jia Zhang; Bi-feng Zhang; Li-min Xiong; Tao-geng Zhou; Jun-chao Zhang; Hai-feng Meng; Chuan Cai; Ying-wei He; Xiao-hui Li; Chang-shi Wang
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Paper Abstract

Based on a testing method of spatial frequency response(SFR), a setup for characteristics measurements of the infrared defect tester,which can also be called electroluminescence tester(EL tester), a machine examining defects of photovoltaic (PV) panel, was built. The influences of focusing plane adjustments and infrared light box arrangements on resolution measurement of EL tester in full field of view were analyzed. For different types of EL testers, portable and fixed, testing methods and procedures were presented. Especially, a novel testing method for portable EL was claimed, which could do the work well without reference background. Based on method claimed and setup built, the resolutions of different types of EL testers were obtained and stable results were achieved. This setup is portable designed to meet online measurements requirements of PV industry.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104601F (24 October 2017); doi: 10.1117/12.2285194
Show Author Affiliations
Ke-jia Zhang, Beijing Institute of Technology (China)
Bi-feng Zhang, National Institute of Metrology (China)
Li-min Xiong, National Institute of Metrology (China)
Tao-geng Zhou, Beijing Institute of Technology (China)
Jun-chao Zhang, National Institute of Metrology (China)
Hai-feng Meng, National Institute of Metrology (China)
Chuan Cai, National Institute of Metrology (China)
Ying-wei He, National Institute of Metrology (China)
Xiao-hui Li, Beijing Institute of Technology (China)
Chang-shi Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 10460:
AOPC 2017: Optoelectronics and Micro/Nano-Optics
Min Qiu; Min Gu; Xiaocong Yuan; Zhiping Zhou, Editor(s)

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