Share Email Print
cover

Proceedings Paper

High-precision attitude angle measuring system based on Talbot interferometry
Author(s): Juan Du; Jian Bai; Xiao Huang; Yujie Luo; Yupeng Luo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A traditional tracking device obtain the attitude angle by analyzing the spots position on photodetector. However, the attainable angular measurement accuracy depends on the field of view (FOV), number of pixels of the photodetector and the centroiding algorithm. In this paper, we present a high-precision attitude angle measuring system based on Talbot interferometry using cross-gratings and four wedge plates, which can acquire the real-time change of incident angle along two axis. The specific structure of the system is introduced, and the formula for calculating the relative angle is derived. The tracking accuracy is analyzed to be better than 0.2 arcsecond, which is dependent on the grating period, the distance between the two gratings and the gray scale of image. The Simulation results show that the RMS error of relative angle is better than 0.1 arcsecond both in x and y direction.

Paper Details

Date Published:
PDF: 11 pages
Proc. SPIE 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications, 104623L; doi: 10.1117/12.2285187
Show Author Affiliations
Juan Du, Zhejiang Univ. (China)
Jian Bai, Zhejiang Univ. (China)
Xiao Huang, Zhejiang Univ. (China)
Yujie Luo, Zhejiang Univ. (China)
Yupeng Luo, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 10462:
AOPC 2017: Optical Sensing and Imaging Technology and Applications
Yadong Jiang; Haimei Gong; Weibiao Chen; Jin Li, Editor(s)

© SPIE. Terms of Use
Back to Top