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Proceedings Paper • new

The optical properties and stability of submicron hollow particles
Author(s): Ya'nan Li; Yongqing Li; Qun Wang; Shikui Dong; Lei Mu; Jiaqi Liu
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Paper Abstract

Based on optical scattering theory of Aden–Kerker method, the extinction efficiencies of submicron hollow particles with 5 kinds of materials, such as graphite(C), brass powder (Cu), cupric oxide (CuO), cuprous oxide(Cu2O) and soot are given in this paper. Some influences of different materials, inner radius (x), outer radius (y), shell thickness (z) and x-z ratio(x/z) on the extinction efficiencies are studied respectively. Owing to lack of literature data, the optical constants of C, Cu, CuO, and Cu2O are firstly obtained by measuring infrared spectral transmittance of material piece and retrieving the equivalent optical constants combined with electromagnetic scattering theory and K-K relation. The results show that particle C, Cu, Cu2O and Soot have a good performance in stability of extinction efficiency distribution within 3-5μm; the extinction efficiencies of C, Cu, Soot decrease gradually with the shortening of the wavelength within 3-5μm; the extinction efficiency of all kinds of particles increase along with outer radius y increased when shell thickness z is fixed.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 1046019 (24 October 2017); doi: 10.1117/12.2284943
Show Author Affiliations
Ya'nan Li, National Key Lab. of Science and Technology on Test Physics and Numerical Mathematics (China)
Beijing Univ. of Technology (China)
Yongqing Li, Beijing Univ. of Technology (China)
Qun Wang, Beijing Univ. of Technology (China)
Shikui Dong, Harbin Institute of Technology (China)
Lei Mu, National Key Lab. of Science and Technology on Test Physics and Numerical Mathematics (China)
Jiaqi Liu, National Key Lab. of Science and Technology on Test Physics and Numerical Mathematics (China)


Published in SPIE Proceedings Vol. 10460:
AOPC 2017: Optoelectronics and Micro/Nano-Optics
Min Qiu; Min Gu; Xiaocong Yuan; Zhiping Zhou, Editor(s)

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