Share Email Print
cover

Proceedings Paper

Noise properties of the calculated linear polarization image
Author(s): Jian'an Liang; Xia Wang; Si He; Weiqi Jin; Xiaotian Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A method of calculating the 1D polarimeter imaging results from 3D polarimeter intensity measurements is introduced, and the influence of the detector noise on the calculated results is studied. Noise analysis is mainly carried out for the commonly used Pickering imaging method, Fessenkovs imaging method and modified Pickering imaging method with additive noise and shot noise as real noise sources. The analysis and simulation results show that, if the analyzer angles are evenly distributed over the half-circle, the additive noise variance of the calculated image is only related to the channel number N of the polarization imaging system, and the shot noise variance of the calculated image is related to the Stokes vector, the calculated angle, the channel number N and the polarization imaging modality. If the analyzer angles are not evenly distributed over the half-circle, concrete analysis should be made according to concrete circumstance. On the whole, the modified Pickering method is a recommended imaging modality by reason of it can suppress the noise of the calculated image because it has more channel numbers and it is not affected by the incident Stokes vector or the calculated angle.

Paper Details

Date Published: 24 October 2017
PDF: 10 pages
Proc. SPIE 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications, 104622S (24 October 2017); doi: 10.1117/12.2284931
Show Author Affiliations
Jian'an Liang, Beijing Institute of Technology (China)
Xia Wang, Beijing Institute of Technology (China)
Si He, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)
Xiaotian Lu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 10462:
AOPC 2017: Optical Sensing and Imaging Technology and Applications
Yadong Jiang; Haimei Gong; Weibiao Chen; Jin Li, Editor(s)

© SPIE. Terms of Use
Back to Top