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An accurate method for investigation of laser-induced damage of optical component at 351nm
Author(s): Xinda Zhou; Lei Ding; Yinbo Zheng; Jie Li; Rongsheng Ba; Honglei Xu; Jing Yuan; Bo Chen
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Paper Abstract

A multipurpose laser damage test facility delivering pulses from 1ns to 20ns and designed to output energy 40 Joule at 351nm is presented. The laser induced damage threshold (LIDT) measurement and test procedure are performed. The original system consist of the online detection system based on the microscopy and an energy detection device based on the scientific grade Charge Coupled Device (CCD) which provides the method to measure the LIDT with high accuracy. This method is an efficient way that allows measuring a small area fluence which the defect exposed. After complete test procedure and data treatment the damage position of the defect has been found. Then we can obtain the local fluence of small area when the damage occurred. This procedure provides a straightforward means of laser-damage threshold obtained from the test method. Damage correlation of measures is discussed in connection with present theoretical understanding of laser damage phenomenon. The damage process in transparent dielectric materials being the results of complex processes involving multi-photon ionization, avalanche ionization, electron-phonon coupling, and thermal effects. Those complex processes lead to the damage on the optical surface. We performed a method to measure the local fluence which defects irradiated with high accurate.

Paper Details

Date Published: 24 October 2017
PDF: 5 pages
Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104572D (24 October 2017); doi: 10.1117/12.2284813
Show Author Affiliations
Xinda Zhou, China Academy of Engineering Physics (China)
Lei Ding, China Academy of Engineering Physics (China)
Yinbo Zheng, China Academy of Engineering Physics (China)
Jie Li, China Academy of Engineering Physics (China)
Rongsheng Ba, China Academy of Engineering Physics (China)
Honglei Xu, China Academy of Engineering Physics (China)
Jing Yuan, China Academy of Engineering Physics (China)
Bo Chen, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 10457:
AOPC 2017: Laser Components, Systems, and Applications
Shibin Jiang; Lijun Wang; Lan Jiang; Long Zhang, Editor(s)

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