Share Email Print
cover

Proceedings Paper

Research on the calibration methods of the luminance parameter of radiation luminance meters
Author(s): Weihai Cheng; Biyong Huang; Fangsheng Lin; Tiecheng Li; Dejin Yin; Lei Lai
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper introduces standard diffusion reflection white plate method and integrating sphere standard luminance source method to calibrate the luminance parameter. The paper compares the effects of calibration results by using these two methods through principle analysis and experimental verification. After using two methods to calibrate the same radiation luminance meter, the data obtained verifies the testing results of the two methods are both reliable. The results show that the display value using standard white plate method has fewer errors and better reproducibility. However, standard luminance source method is more convenient and suitable for on-site calibration. Moreover, standard luminance source method has wider range and can test the linear performance of the instruments.

Paper Details

Date Published: 24 October 2017
PDF: 5 pages
Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 1046014 (24 October 2017); doi: 10.1117/12.2284618
Show Author Affiliations
Weihai Cheng, Shanghai Institute of Measurement and Testing Technology (China)
Biyong Huang, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 10460:
AOPC 2017: Optoelectronics and Micro/Nano-Optics
Min Qiu; Min Gu; Xiaocong Yuan; Zhiping Zhou, Editor(s)

© SPIE. Terms of Use
Back to Top