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Proceedings Paper

Super-resolved thickness maps using ultrahigh resolution OCT
Author(s): Valentin Aranha dos Santos; Leopold Schmetterer; Graham J. Triggs; Rainer A. Leitgeb; René M. Werkmeister
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Paper Abstract

OCT imaging in the super-resolution regime was investigated using simulations and experiments. Samples of known thickness in the range 46-163 nm were fabricated and imaged. Measurements of the tear film lipid layer were performed.

Paper Details

Date Published: 1 August 2017
PDF: 4 pages
Proc. SPIE 10416, Optical Coherence Imaging Techniques and Imaging in Scattering Media II, 1041606 (1 August 2017); doi: 10.1117/12.2284530
Show Author Affiliations
Valentin Aranha dos Santos, Medical Univ. of Vienna (Austria)
Vienna Univ. of Technology (Austria)
Leopold Schmetterer, Medical Univ. of Vienna (Austria)
Graham J. Triggs, Univ. of York (United Kingdom)
Rainer A. Leitgeb, Medical Univ. of Vienna (Austria)
René M. Werkmeister, Medical Univ. of Vienna (Austria)


Published in SPIE Proceedings Vol. 10416:
Optical Coherence Imaging Techniques and Imaging in Scattering Media II
Maciej Wojtkowski; Stephen A. Boppart; Wang-Yuhl Oh, Editor(s)

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