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Spectral resolution enhancement of Fourier-transform spectrometer based on orthogonal shear interference using Wollaston prism
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Paper Abstract

In this paper, a multi-line interferogram stitching method based on orthogonal shear using the Wollaston prism(WP) was proposed with a 2D projection interferogram recorded through the rotation of CCD, making the spectral resolution of Fourier-Transform spectrometer(FTS) of a limited spatial size increase by at least three times. The fringes on multi-lines were linked with the pixels of equal optical path difference (OPD). Ideally, the error of sampled phase within one pixel was less than half the wavelength, ensuring consecutive values in the over-sampled dimension while aliasing in another. In the simulation, with the calibration of 1.064μm, spectral lines at 1.31μm and 1.56μm of equal intensity were tested and observed. The result showed a bias of 0.13% at 1.31μm and 1.15% at 1.56μm in amplitude, and the FWHM at 1.31μm reduced from 25nm to 8nm after the sample points increased from 320 to 960. In the comparison of reflectance spectrum of carnauba wax within near infrared(NIR) band, the absorption peak at 1.2μm was more obvious and zoom of the band 1.38~1.43μm closer to the reference, although some fluctuation was in the short-wavelength region arousing the spectral crosstalk. In conclusion, with orthogonal shear based on the rotation of the CCD relative to the axis of WP, the spectral resolution of static FTS was enhanced by the projection of fringes to the grid coordinates and stitching the interferograms into a larger OPD, which showed the advantages of cost and miniaturization in the space-constrained NIR applications.

Paper Details

Date Published: 24 October 2017
PDF: 8 pages
Proc. SPIE 10461, AOPC 2017: Optical Spectroscopy and Imaging, 104610W (24 October 2017); doi: 10.1117/12.2284436
Show Author Affiliations
Lin-xiao Cong, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Min Huang, Academy of Opto-Electronics (China)
Qi-sheng Cai, Academy of Opto-Electronics (China)


Published in SPIE Proceedings Vol. 10461:
AOPC 2017: Optical Spectroscopy and Imaging
Jin Yu; Zhe Wang; Wei Hang; Bing Zhao; Xiandeng Hou; Mengxia Xie; Tsutomu Shimura, Editor(s)

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