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Proceedings Paper

Improved bi-frequency scheme to realize high-precision 3D shape measurement
Author(s): Tianyang Tao; Qian Chen; Shijie Feng; Yan Hu; Chao Zuo
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Paper Abstract

An improved bi-frequency phase-shifting technique based on a multi-view fringe projection system is proposed, which significantly enhances the measurement precision without compromising the measurement speed. Based on the geometric constraints in a multi-view system, the unwrapped phase of the low-frequency (10-period) fringes can be obtained directly, which serves as a reference to unwrap the high-frequency phase map with a total number of periods of up to 160. Experiments on both static and dynamic scenes are performed, verifying that our method can achieve real-time and high-precision 3-D measurement with a precision of about 50 μm.

Paper Details

Date Published: 24 October 2017
PDF: 5 pages
Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 104580Y (24 October 2017); doi: 10.1117/12.2284276
Show Author Affiliations
Tianyang Tao, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Shijie Feng, Nanjing Univ. of Science and Technology (China)
Yan Hu, Nanjing Univ. of Science and Technology (China)
Chao Zuo, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10458:
AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
Wolfgang Osten; Anand Krishna Asundi; Huijie Zhao, Editor(s)

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