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Proceedings Paper

Photorefractive approaches to optical interconnects
Author(s): Lambertus Hesselink
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Paper Abstract

Optical implementations of interconnects for digital processors are being inves- tigated for their high bandwidth, large interconnect density and high level of immu- nity from interference. Implementations can be categorized into several classes, in- cluding fiber optics, holographic approaches and integrated optics. Photorefractives appear to be attractive media for interconnects requiring dynamic reconfiguration capabilities. The attractiveness stems from the ability to record large multiple inter- connect patterns on a time scale of milliseconds using modest laser powers, typically of a few mW/cm2. Few of the interconnect architectures that have been explored so far take advantage of the dynamic holographic recording properties of photore- fractives, and key issues related to holographic recording of interconnect patterns in these media still need to be considered. For example, fixing approaches are re- quired to record and store multiple holograms with minimum crosstalk, and update strategies are necessary for modifying or removing interconnect patterns without affecting the others. In this paper we dwell on the pertinent physical characteristics of photorefractives, and discuss implications for optical interconnects. For example, we present a procedure for prolonged readout, an architecture for Bragg matched diffraction with light of a different wavelength than is used for recording, a novel approach to a large recording medium consisting of an SBN fiber bundle, and a very high density integrated optical interconnect of 100x100 switches per square centimeter.

Paper Details

Date Published: 16 January 1990
PDF: 16 pages
Proc. SPIE 10257, Digital Optical Computing: A Critical Review, 1025703 (16 January 1990); doi: 10.1117/12.2283567
Show Author Affiliations
Lambertus Hesselink, Stanford Univ. (United States)


Published in SPIE Proceedings Vol. 10257:
Digital Optical Computing: A Critical Review
R. Athale, Editor(s)

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