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Proceedings Paper

Adaptive neural network non-uniformity correction algorithm for infrared focal plane array based on bi-exponential edge-preserving smoother
Author(s): Yongyi Yu; Lingxiao Li; Huajun Feng; Zhihai Xu; Qi Li; Yueting Chen; Haiying Hu
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Paper Abstract

In this paper, a new algorithm for non-uniformity correction of infrared focal plane arrays based on neural network and bi-exponential filter is proposed. Due to the edge preserving property of bi-exponential filter, the algorithm can estimate the gain and bias coefficients at the strong edge more accurately, thereby suppressing the ghosting effect. In order to suppress the blurring effect, a motion detection is carried out before the correction coefficients are updated. A motion evaluation index based on the L1 norm of the temporal variation of the image and the image roughness is designed to improve the accuracy of motion detection. Moreover, an adaptive learning rate calculation method is proposed, which makes the learning rate larger in the image smoothing region and smaller in the edge region. This results in a faster convergence in a uniform region of the image , and it is not easy to cause a correction coefficients estimation error in the edge region. Several infrared image sequences are used to verify the performance of the proposed algorithm. The results indicate that the proposed method can not only preserve the details of the image, but also reduce the non-uniformity. Besides, it has a good inhibitory effect on the phenomenon of ”ghosting” and ”blurring”.

Paper Details

Date Published: 24 October 2017
PDF: 6 pages
Proc. SPIE 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications, 1046215 (24 October 2017); doi: 10.1117/12.2283262
Show Author Affiliations
Yongyi Yu, Zhejiang Univ. (China)
Lingxiao Li, Zhejiang Univ. (China)
Huajun Feng, Zhejiang Univ. (China)
Zhihai Xu, Zhejiang Univ. (China)
Qi Li, Zhejiang Univ. (China)
Yueting Chen, Zhejiang Univ. (China)
Haiying Hu, Shanghai Engineering Ctr. for Microsatellites (China)

Published in SPIE Proceedings Vol. 10462:
AOPC 2017: Optical Sensing and Imaging Technology and Applications
Yadong Jiang; Haimei Gong; Weibiao Chen; Jin Li, Editor(s)

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