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Proceedings Paper

Experiment of optical axis angle of electro-optic crystal by conoscopic interference and x-ray diffraction method
Author(s): Dong Li; Yong Liu; Xu Liu; Hongzhen Jiang; Fanglan Zheng
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Paper Abstract

Owing to the advantages of low loss, high spatial uniformity and high damage threshold, plasma electrode pockels cell (PEPC) is the key element of multi-pass amplifying technology in large laser facilities. Properties of PEPC is directly affected by the optical axis angle of the electro-optic crystal. Therefore, high precision measurement of the optical axis angle is indispensable. X-ray diffraction analysis method is a traditional way to determine the direction of optical axis of crystal, which is presented. By using conoscopic interference technique, a measurement system for optical axis angle of electro-optic crystal is introduced. The principle of conoscopic interference method is described in detail, and a series of techniques are implied in this measurement system to improve the accuracy. The optical axis angle two different electro-optic crystal is measured by X-ray diffraction analysis method and our conoscopic interference measurement system, respectively. The absolute error is less than 0.01mrad, while the relative error is nearly 2%.

Paper Details

Date Published: 24 October 2017
PDF: 4 pages
Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104570R (24 October 2017); doi: 10.1117/12.2283131
Show Author Affiliations
Dong Li, China Academy of Engineering Physics (China)
Yong Liu, China Academy of Engineering Physics (China)
Xu Liu, China Academy of Engineering Physics (China)
Hongzhen Jiang, China Academy of Engineering Physics (China)
Fanglan Zheng, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 10457:
AOPC 2017: Laser Components, Systems, and Applications
Shibin Jiang; Lijun Wang; Lan Jiang; Long Zhang, Editor(s)

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