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Proceedings Paper

Quartz 9-inch size mask blanks for ArF PSM (Phase Shift Mask)
Author(s): Noriyuki Harashima; Tatsuya Isozaki; Arata Kawanishi; Shuichiro Kanai; Kagehiro Kageyama; Hiroyuki Iso; Tatsuya Chishima
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Paper Abstract

Semiconductor technology nodes are steadily miniaturizing. On the other hand, various efforts have been made to reduce costs, mass production lines have shifted from 200 mmφ of Si wafer to 300 mmφ, and technology development of Si wafer 450 mmφ is also in progress. As a photomask, 6-inch size binary Cr mask has been used for many years, but in recent years, the use of 9-inch binary Cr masks for Proximity Lithography Process in automotive applications, MEMS, packages, etc. has increased, and cost reduction has been taken. Since the miniaturization will progress in the above applications in the future, products corresponding to miniaturization are also desired in 9-inch photomasks. The high grade Cr - binary mask blanks used in proximity exposure process, there is a prospect of being able to use it by ULVAC COATING CORPORATION's tireless research. As further demands for miniaturization, KrF and ArF Lithography Process, which are used for steppers and scanners , there are also a demand for 9-inch size Mask Blanks. In ULVAC COATING CORPORATION, we developed a 9 - inch size KrF PSM mask Blanks prototype in 2016 and proposed a new high grade 9 - inch photomask. This time, we have further investigated and developed 9-inch size ArF PSM Mask Blanks corresponding to ArF Lithography Process, so we report it.

Paper Details

Date Published: 13 July 2017
PDF: 6 pages
Proc. SPIE 10454, Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology, 104540S (13 July 2017); doi: 10.1117/12.2282803
Show Author Affiliations
Noriyuki Harashima, ULVAC Coating Corp. (Japan)
Tatsuya Isozaki, ULVAC Coating Corp. (Japan)
Arata Kawanishi, ULVAC Coating Corp. (Japan)
Shuichiro Kanai, ULVAC Coating Corp. (Japan)
Kagehiro Kageyama, ULVAC Coating Corp. (Japan)
Hiroyuki Iso, ULVAC Coating Corp. (Japan)
Tatsuya Chishima, ULVAC Coating Corp. (Japan)

Published in SPIE Proceedings Vol. 10454:
Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology
Kiwamu Takehisa, Editor(s)

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