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Proceedings Paper

Laser-scanning lens configurations
Author(s): Edara K. Murthy
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Paper Abstract

Four new optical system configurations (-÷-++--, +÷-++-, -+-+- and +-++-) are concieved for a laser scanning lens from fundamental thifl lens equations and optimized for diffraction limited performance. The speciality of these designs is the absence of thick meniscus concentric (1) elements. Also the article explains the circumstances forcing the use of thick meniscus elements. The six-element designs are having small rms spot sizes. These spot sizes are relatively insensitive to the position errors as compared to the other published/communicated ones (2, 3 and 4). The rms spot sizes at various zones are compared to understand the relative merits of the present designs with the published ones. In this study, percentage position errors at the respective zones, telecentricity, efl and bfl are retained at the same values as those of published ones. When the rms spot sizes are of the same order in both the designs under comparison, then design with less distance between the aperture stop and image is found to be better. Out of the two six-element types, one having configuration (++-+÷-) showed better performance compared to the other in all respects. Also in this design, the rms spot sizes are practically unchanged when position error is changed from 0.90% to 0.006%. Two four element configurations (+-+- and -++-) are also optimized and compared with the one (-++-) recieved (5). The two published (2, 3) configurations (-++++- and -+++-) are considered along with the above. The characteristics of the resulting seventeen designs are discussed in the later part of the paper.

Paper Details

Date Published: 1 November 1990
PDF: 14 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22828
Show Author Affiliations
Edara K. Murthy, Central Scientific Instruments Organisation (India)

Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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