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Proceedings Paper

Correlation of RTV properties to test data and its effect on the AXAF mirror performance
Author(s): Simon Chia-Fu Sheng; Oscar Berendsohn; Martin R. Schreibman; Lester M. Cohen
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Paper Abstract

Using RTV rubber as an interface between mirror elements and their supporting structures during grinding and polishing was proposed for the Advanced X-ray Astrophysics Facility (AXAF) for glass safety concerns. This paper shows that the mirror performance is quite sensitive to the compression modulus of GE RTV-60 which, like all other rubber-like materials, is very difficult to characterize by testing and even more difficult to characterize analytically. Consequently, using representative RTV properties in mirror analyses only produces nominal performance predictions. The envelope of the range of performance has to be determined by using both extremes of the RTV compression modulus. This paper also presents a comparison between compression moduli generated via testing and that from semi-empirical formulas. The agreement is satisfactory when mean values of the test data are used for comparison and the shape factor is modified to include partially constrained surfaces. The scatter ranges from 7.6% to 23.0% depending upon the way the RTV samples were cast. Using an error of about 16.2, we were still able to meet the error budget requirements for the Glass Support Fixture (GSF).

Paper Details

Date Published: 1 November 1990
PDF: 11 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22826
Show Author Affiliations
Simon Chia-Fu Sheng, Hughes Danbury Optical Systems (United States)
Oscar Berendsohn, Hughes Danbury Optical Systems, Inc. (United States)
Martin R. Schreibman, Hughes Danbury Optical Systems, Inc. (United States)
Lester M. Cohen, Smithsonian Astrophysical Obse (United States)


Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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