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Proceedings Paper

Single image dedusting by non-overlap stitching
Author(s): Yuanyu Wang; Yifan Zhang; Min Zhang
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Paper Abstract

A novel single image dedusting method based on non-overlap stitching is investigated to solve the issue of image degradation in the non-uniform dusty environment with multiple scattering light. First, the first-order multiple scattering model is used to produce recovered images of the original dusty image by different transmission values. Then each recovered image is classified to clear and dusty regions using an improved dust detection operation by which the clear regions are kept. By repeating the first two steps and by reducing transmission value from 1 to the terminal value optimized by a cost function, series clear regions are produced. Finally, all clear regions with the rest dusty regions in the last recovered image are stitched into a restored image. Experimental results show that this method can effectively remove dust in the image and significantly improve the image quality obviously.

Paper Details

Date Published: 21 July 2017
PDF: 5 pages
Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104201Y (21 July 2017); doi: 10.1117/12.2282526
Show Author Affiliations
Yuanyu Wang, Taiyuan Univ. of Technology (China)
Yifan Zhang, Taiyuan Univ. of Technology (China)
Min Zhang, Taiyuan Univ. of Technology (China)

Published in SPIE Proceedings Vol. 10420:
Ninth International Conference on Digital Image Processing (ICDIP 2017)
Charles M. Falco; Xudong Jiang, Editor(s)

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