Share Email Print
cover

Proceedings Paper

Target region location method applied in single-pixel imaging
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Single-pixel imaging (SPI) is a new method to obtain an image using a detector without spatial resolution. Owing to the excellent characteristics of anti-noise and high signal-to-noise ratio, SPI is applied to detect and locate the target region in the week illumination condition. In most previous target detection and location approaches, the original target needs to be imaged. However, the time consumption of image reconstruction for SPI is much larger than conventional imaging method, which indicates a low efficiency for target region location using SPI. In this paper, we propose a target region location method based on Fourier single-pixel imaging to locate the target without retrieving target image. The proposed method adopts the Fourier single-pixel imaging to obtain few Fourier coefficients of the target image, then the target region is located by the central slice theorem and edge detection algorithm. Experiment shows the proposed method has an excellent characteristic of low time consumption and can effectively locate the target region.

Paper Details

Date Published: 24 October 2017
PDF: 5 pages
Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 104580E (24 October 2017); doi: 10.1117/12.2282354
Show Author Affiliations
Hongzhi Jiang, Beihang Univ. (China)
Shuguang Zhu, Beihang Univ. (China)
Huijie Zhao, Beihang Univ. (China)
Xudong Li, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 10458:
AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
Wolfgang Osten; Anand Krishna Asundi; Huijie Zhao, Editor(s)

© SPIE. Terms of Use
Back to Top