Share Email Print

Proceedings Paper

Soft-error-rate model for optimizing MR read and write widths
Author(s): Mathew P. Vea
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe a semi-empirical model that predicts the soft error rate of a magnetic recording system with magnetoresistive heads. The model has a small number of input parameters that define the read and write widths of the head as well as the on-track performance and the susceptibility to off-track interference of the read channel. The model has been tested by comparison to off-track error rate data from a peak detect channel, with good agreement, and by comparison to another soft error rate model developed by Wiesen, et. al. The two models agree on the optimal write width for a 4.3 micrometer track pitch, but our model predicts a smaller optimal read width than the Wiesen model. Off-track error rate curves and on-track error vs. head width curves from the two models are compared to understand this difference in predicted optimal read width.

Paper Details

Date Published: 8 December 1995
PDF: 11 pages
Proc. SPIE 2605, Coding and Signal Processing for Information Storage, (8 December 1995); doi: 10.1117/12.228227
Show Author Affiliations
Mathew P. Vea, Quantum Corp. (United States)

Published in SPIE Proceedings Vol. 2605:
Coding and Signal Processing for Information Storage
Raghuveer M. Rao; Soheil A. Dianat; Steven W. McLaughlin; Martin Hassner, Editor(s)

© SPIE. Terms of Use
Back to Top