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Integrated test system of infrared and laser data based on USB 3.0
Author(s): Hui Quan Fu; Lin Bo Tang; Chao Zhang; Bao Jun Zhao; Mao Wen Li
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Paper Abstract

Based on USB3.0, this paper presents the design method of an integrated test system for both infrared image data and laser signal data processing module. The core of the design is FPGA logic control, the design uses dual-chip DDR3 SDRAM to achieve high-speed laser data cache, and receive parallel LVDS image data through serial-to-parallel conversion chip, and it achieves high-speed data communication between the system and host computer through the USB3.0 bus. The experimental results show that the developed PC software realizes the real-time display of 14-bit LVDS original image after 14-to-8 bit conversion and JPEG2000 compressed image after decompression in software, and can realize the real-time display of the acquired laser signal data. The correctness of the test system design is verified, indicating that the interface link is normal.

Paper Details

Date Published: 21 July 2017
PDF: 8 pages
Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104204D (21 July 2017); doi: 10.1117/12.2281653
Show Author Affiliations
Hui Quan Fu, Beijing Institute of Technology (China)
Lin Bo Tang, Beijing Institute of Technology (China)
Chao Zhang, Beijing Institute of Technology (China)
Bao Jun Zhao, Beijing Institute of Technology (China)
Mao Wen Li, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 10420:
Ninth International Conference on Digital Image Processing (ICDIP 2017)
Charles M. Falco; Xudong Jiang, Editor(s)

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