
Proceedings Paper
Damage testing of nematic liquid crystalline materials for femtosecond to nanosecond pulse lengths at 1053 nmFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
Damage-test data are scarce for liquid crystalline (LC) materials at 1-ns pulse lengths and nonexistent at shorter pulselengths.
Here we describe the methodology to develop a comprehensive database of damage performance for typical
nematic LC’s for a wide range of pulse lengths at 1053 nm. This series of nematic LC materials investigates the effect of
a varying degree of π-electron delocalization. Obtaining damage-threshold measurements is of fundamental interest for
the consideration of LC materials for applications in short-pulse laser systems.
Paper Details
Date Published: 20 December 2017
PDF: 5 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471G (20 December 2017); doi: 10.1117/12.2281406
Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)
PDF: 5 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471G (20 December 2017); doi: 10.1117/12.2281406
Show Author Affiliations
T. Z. Kosc, Univ. of Rochester (United States)
K. L. Marshall, Univ. of Rochester (United States)
A. A. Kozlov, Univ. of Rochester (United States)
K. L. Marshall, Univ. of Rochester (United States)
A. A. Kozlov, Univ. of Rochester (United States)
Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)
© SPIE. Terms of Use
