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Proceedings Paper

Properties of reactively sputtered AlxNy thin films for pyroelectric detectors
Author(s): Nicholas Calvano; Philip Chrostoski; Andrew Voshell; Keesean Braithwaite; Mukti Rana
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Paper Abstract

Uncooled infrared detectors are utilized in various radiometric devices and cameras because of their low cost, light weight and performance. A pyroelectric detector is a class of uncooled infrared detector whose polarization changes with change in temperature. Infrared radiation from objects falls on top of the sensing layer of the pyroelectric detector and the absorbed radiation causes the temperature of the sensing layer to change. This work describes the deposition and characterization of AlxNy thin films for using them as pyroelectric detector’s sensing material. To test the sensitivity of infrared detection or pyroelectric effect of AlxNy thin films, capacitors of various sizes were fabricated. The diameter of the electrodes for capacitor used during testing of the device was 1100 μm while the distances between these two electrodes was 1100 μm. On a 3-inch diameter cleaned silicon wafer, 100 nm thick AlxNy thin films were deposited by radio frequency (RF) sputtering from an Al target in Ar: N2 environment. On top of this, a 100-nm thick Au layer was deposited and lifted off by using conventional photo lithography to form the electrodes of capacitors. All the layers were deposited by RF sputtering at room temperature. The thin film samples were annealed at 700 °C in N2 environment for 10 minutes. X-ray diffraction showed the films are poly-crystalline with peaks in (100), (002) and (101) directions. When the temperature varied between 303 K to 353 K, the pyroelectric coefficient was increased from 8.60 × 10-9 C/m2K to 3.76 × 10-8C/m2K with a room temperature pyroelectric coefficient value of 8.60×10-9C/m2K. The non-annealed films were found to be transparent between the wavelengths of 600 nm to 3000 nm. The refraction coefficient was found to be varied between 2.0 and 2.2 while the extinction coefficient was found to be zero. The optical bandgap determined using Tauc’s equation was 1.65 eV.

Paper Details

Date Published: 23 August 2017
PDF: 8 pages
Proc. SPIE 10381, Wide Bandgap Power Devices and Applications II, 103810J (23 August 2017); doi: 10.1117/12.2281240
Show Author Affiliations
Nicholas Calvano, Delaware State Univ. (United States)
Philip Chrostoski, Delaware State Univ. (United States)
Andrew Voshell, Delaware State Univ. (United States)
Keesean Braithwaite, Delaware State Univ. (United States)
Mukti Rana, Delaware State Univ. (United States)

Published in SPIE Proceedings Vol. 10381:
Wide Bandgap Power Devices and Applications II
Mohammad Matin; Srabanti Chowdhury; Achyut K. Dutta, Editor(s)

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