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Proceedings Paper

Optical limiting and excited-state absorption in fullerene solutions and doped glasses
Author(s): Duncan W. McBranch; Laura B. Smilowitz; Victor I. Klimov; Aaron C. Koskelo; Jeanne M. Robinson; Benjamin R. Mattes; Jan C. Hummelen; Fred Wudl; James C. Withers; Nicholas F. Borrelli
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Paper Abstract

We report the ground-state and excited-state optical absorption spectra in the visible and near infrared for several substituted fullerenes and higher fullerenes in toluene solutions. Based on these measurements, broadband predictions of the optical limiting performance of these molecules can be deduced. These predictions are then tested in the wavelength range from 532 nm to 700 nm in intensity-dependent transmission measurements. We observe optical limiting in all fullerenes measured; higher fullerenes show the greatest potential for limiting in the near infrared (650 - 1000 nm), while substituted C60 shows optimal limiting in the visible (450 - 700 nm). We observe dramatically reduced limiting for solid forms of C60 (thin films and C60-doped porous glasses), indicating that efficient optical limiting in fullerenes requires true molecular solutions.

Paper Details

Date Published: 8 December 1995
PDF: 9 pages
Proc. SPIE 2530, Fullerenes and Photonics II, (8 December 1995); doi: 10.1117/12.228119
Show Author Affiliations
Duncan W. McBranch, Los Alamos National Lab. (United States)
Laura B. Smilowitz, Los Alamos National Lab. (United States)
Victor I. Klimov, Los Alamos National Lab. (United States)
Aaron C. Koskelo, Los Alamos National Lab. (United States)
Jeanne M. Robinson, Los Alamos National Lab. (United States)
Benjamin R. Mattes, Los Alamos National Lab. (United States)
Jan C. Hummelen, Univ. of California/Santa Barbara (United States)
Fred Wudl, Univ. of California/Santa Barbara (United States)
James C. Withers, Materials and Electrochemical Research Corp. (United States)
Nicholas F. Borrelli, Corning Inc. (United States)


Published in SPIE Proceedings Vol. 2530:
Fullerenes and Photonics II
Zakya H. Kafafi, Editor(s)

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