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Proceedings Paper

Efficient phase extraction from three random interferograms based on Lissajous figure and ellipse fitting method
Author(s): Hebing Lei; Yong Yao; Haopeng Liu; Yanfu Yang
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Paper Abstract

To deal with both of the fluctuation of background intensity and the random phase shift error, this paper present an efficient and rapid phase extraction algorithm. The parametric equations of Lissajous ellipse are derived by subtraction operations on three random interferograms. Then the elliptic parameters are calculated by ellipse fitting, which is used for phase extraction. It is unnecessary for the algorithm to calculate the random phase shift value and remove the background term, which reduces the algorithm’s complexity and shortens the processing time. The effectiveness and reliability of the algorithm are verified by both the numerical simulations and the experiment. The results shows that the algorithm is robust to the fluctuation of background intensity and modulation amplitude.

Paper Details

Date Published: 24 October 2017
PDF: 6 pages
Proc. SPIE 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing, 1045803 (24 October 2017); doi: 10.1117/12.2281177
Show Author Affiliations
Hebing Lei, Harbin Institute of Technology (China)
Yong Yao, Harbin Institute of Technology (China)
Haopeng Liu, Harbin Institute of Technology (China)
Yanfu Yang, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 10458:
AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
Wolfgang Osten; Anand Krishna Asundi; Huijie Zhao, Editor(s)

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