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Proceedings Paper

On-machine measurement of roughness, waviness, and flaws
Author(s): Lionel R. Baker
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Paper Abstract

Recent developnients in the technology of surface generation are directed towards higher quality and reduced costs using an everincreasing range of optical materials. These goals require the use of objective methods of measurement to ensure that the desired end- points are within thresholds of acceptance at the instant these occur. This paper reviews progress in the development of methods of measurement of surface roughness, waviness and flaws which are likely to be suitable for on-machine use which could be traceable to National Standards, and which might provide outputs suitable for linking the process of design, manufacture and testing necessary to ensure total quality management. Results from recent laboratory assessments on a variety of surface characteristics are presented to illustrate the potential of the methods described.

Paper Details

Date Published: 1 November 1990
PDF: 9 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22809
Show Author Affiliations
Lionel R. Baker, Sira Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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