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Predicted static fatigue (delayed fracture) lifetime of a fiber optic test specimen: application of analytical modeling technique
Author(s): E. Suhir; S. Yi
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Paper Abstract

The recently suggested probabilistic design-for-reliability (PDfR) concept, and particularly its physically meaningful and flexible analytical Boltzmann-Arrhenius-Zhurkov (BAZ) model, can be effectively employed as an attractive replacement of the widely used today purely empirical and physically unsubstantiated power law relationship for assessing/predicting the static fatigue (delayed fracture) lifetime of optical silica fibers. The BAZ model can be used to estimate the static fatigue lifetime of a coated optical silica “specialty” fiber intended for high temperature applications and subjected to the combined action of tensile loading and an elevated temperature. BAZ relationship is one of the possible predictive models of the recently suggested probabilistic design for reliability (PDfR) concept. This concept has its experimental basis in the highly-focused and highly-cost-effective failure-oriented accelerated testing (FOAT). Such testing is absolutely crucial, if one intends to understand the underlying reliability physics. It is shown how the PDfR concept, BAZ model and FOAT data can be employed, when there is a need to assess the expected static fatigue lifetime of a coated optical fiber subjected to the combined action of the tensile loading and elevated temperature. The general concept is illustrated by a practical example. The approach could be easily extended for any type of optical fibers, including laser fibers, or even to other types of accelerated testing of optical materials, fibers and devices.

Paper Details

Date Published: 22 February 2018
PDF: 8 pages
Proc. SPIE 10528, Optical Components and Materials XV, 105280W (22 February 2018); doi: 10.1117/12.2280650
Show Author Affiliations
E. Suhir, Bell Labs. (United States) and Portland State Univ. (United States)
Technische Univ. Wien (Austria)
ERS Co. (United States)
S. Yi, Portland State Univ. (United States)


Published in SPIE Proceedings Vol. 10528:
Optical Components and Materials XV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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