Share Email Print

Proceedings Paper

Uncertainty on areal defect density measurements
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper introduces an analysis of the uncertainty of the determination of the areal density of defects. Estimating the density of defects is a fundamental aspect of the study of laser induced damage. The proper accounting for the uncertainty in this measurement is also a seminal matter. This paper introduces two means of estimation of estimating the uncertainty, the so-called frequentist and Bayesian approaches. The paper concludes with a comparison of the results from the two methods.

Paper Details

Date Published: 13 November 2017
PDF: 6 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471Q (13 November 2017); doi: 10.1117/12.2280610
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Aerospace Systems (United States)

Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top