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Proceedings Paper

U.S. National Committee proposed revision to the ISO Laser Damage Standard
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Paper Abstract

This paper reports on the fundamental idea behind a US National Committee, The Optics and Electro-Optics Standards Council (OEOSC) Task Force (TF) 7, proposal for a so-called Type 1 laser damage test procedure. A Type 1 test is designed to give a simple binary, pass or fail, result. Such tests are intended for the transactional type of damage testing typical of acceptance and quality control testing. As such is it intended for bulk of certification of optics for the ability to survive a given fluence, useful for manufacturers of optics and their customers, the system builders. At the root of the proposed method is the probability that an optic of area A will have R or less damage occurrences with a user specified probability P at test fluence Φ. This assessment is made by a survey of area and the observation of n events. The paper presents the derivation of probability of N or less damage sites on A given n events observed in area a. The paper concludes with the remaining steps to development of a useful test procedure based on the idea presented.

Paper Details

Date Published: 21 November 2017
PDF: 6 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471E (21 November 2017); doi: 10.1117/12.2280559
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Aerospace Systems (United States)
Donna Howland, Northrop Grumman Aerospace Systems (United States)
Michael Thomas, Spica Technologies, Inc. (United States)
Trey Turner, Research Electro-Optics, Inc. (United States)
John Bellum, Coherent Technologies (United States)
Ella Field, Sandia National Labs. (United States)
C. Wren Carr, Lawrence Livermore National Lab. (United States)
Gary Shaffer, Quantel USA Inc. (United States)
Matthew Brophy, Optimax Systems, Inc. (United States)
Allen Krisiloff, Triptar Lens Co., Inc. (United States)


Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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