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Proceedings Paper

An accelerated wafer level testing of photonics components using Raspberry Pi
Author(s): Ashesh Sasidharan
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Date Published:
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Proc. SPIE 10537, Silicon Photonics XIII, ; doi: 10.1117/12.2280198
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Ashesh Sasidharan, GLOBALFOUNDRIES Singapore (Singapore)


Published in SPIE Proceedings Vol. 10537:
Silicon Photonics XIII
Graham T. Reed; Andrew P. Knights, Editor(s)

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