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Proceedings Paper

Speed scanning system based on solid-state microchip laser for architectural planning
Author(s): Dmitriy Redka; Alexsandr S. Grishkanich; Egor Kolmakov; Konstantin Tsvetkov
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Paper Abstract

According to the current great interest concerning Large-Scale Metrology applications in many different fields of manufacturing industry, technologies and techniques for dimensional measurement have recently shown a substantial improvement. Ease-of-use, logistic and economic issues, as well as metrological performance, are assuming a more and more important role among system requirements. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of microlasers as radiators on the linear-angular characteristics of existing measurement systems. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of microlasers as radiators on the linear-angular characteristics of existing measurement systems. The system consists of a distributed network-based layout, whose modularity allows to fit differently sized and shaped working volumes by adequately increasing the number of sensing units. Differently from existing spatially distributed metrological instruments, the remote sensor devices are intended to provide embedded data elaboration capabilities, in order to share the overall computational load.

Paper Details

Date Published: 6 October 2017
PDF: 11 pages
Proc. SPIE 10431, Remote Sensing Technologies and Applications in Urban Environments II, 104310Z (6 October 2017); doi: 10.1117/12.2280015
Show Author Affiliations
Dmitriy Redka, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Alexsandr S. Grishkanich, ITMO Univ. (Russian Federation)
Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Egor Kolmakov, ITMO Univ. (Russian Federation)
Konstantin Tsvetkov, JSC Shipbuilding & Ship Repair Technology Ctr. (Russian Federation)


Published in SPIE Proceedings Vol. 10431:
Remote Sensing Technologies and Applications in Urban Environments II
Thilo Erbertseder; Nektarios Chrysoulakis; Ying Zhang; Wieke Heldens, Editor(s)

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