Share Email Print
cover

Proceedings Paper • new

SEM and Raman studies of CNT films on porous Si
Author(s): R. Belka; J. Kęczkowska; M. Suchańska; P. Firek; H. Wronka; M. Kozłowski; J. Radomska; E. Czerwosz; F. Craciunoiu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Carbon nanotube (CNT) films deposited on different porous silica substrates were studied by Scanning Electron Microscopy (SEM) and Raman Spectroscopy (RS). The films samples were prepared by a two-step method consisting of PVD and CVD processes. In the first step the nanocomposite Ni-C film was obtained by evaporation in dynamic vacuum from two separated sources of fullerenes and nickel acetate. Those films were deposited on porous silica and DLC/porous silica substrates. Analysis of SEM imaging showed that the obtained film are composed of carbon nanotubes, the distribution, size and quality of which depend on the type of substrate. The CNT films were studied by RS method to determine the influence of the substrate type on disordering of carbonaceous structure and quality of CNT in deposited films.

Paper Details

Date Published: 7 August 2017
PDF: 8 pages
Proc. SPIE 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017, 104454P (7 August 2017); doi: 10.1117/12.2279986
Show Author Affiliations
R. Belka, Kielce Univ. of Technology (Poland)
J. Kęczkowska, Kielce Univ. of Technology (Poland)
M. Suchańska, Kielce Univ. of Technology (Poland)
P. Firek, Warsaw Univ. of Technology (Poland)
H. Wronka, Tele and Radio Research Institute (Poland)
M. Kozłowski, Tele and Radio Research Institute (Poland)
J. Radomska, Tele and Radio Research Institute (Poland)
E. Czerwosz, Tele and Radio Research Institute (Poland)
F. Craciunoiu, National Institute for Research and Development in Microtechnologies (Romania)


Published in SPIE Proceedings Vol. 10445:
Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

© SPIE. Terms of Use
Back to Top