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Proceedings Paper

Noncontact precision measurement system
Author(s): Ronald Gamache; John Tourtellott; John F. Wagner
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Paper Abstract

A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.

Paper Details

Date Published: 1 November 1990
PDF: 8 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22799
Show Author Affiliations
Ronald Gamache, Mechanical Technology Inc. (United States)
John Tourtellott, Mechanical Technology Inc. (United States)
John F. Wagner, Mechanical Technology Inc. (United States)


Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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