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Proceedings Paper

Spectrally controlled interferometry for measurements of flat and spherical optics
Author(s): Chase Salsbury; Artur G. Olszak
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Paper Abstract

Conventional interferometry is widely used to measure spherical and at surfaces with nanometer level precision but is plagued by back reflections. We describe a new method of isolating the measurement surface by controlling spectral properties of the source (Spectrally Controlled Interferometry - SCI). Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero. As a consequence it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau. The proposed setup does not require mechanical phase shifting, resulting in simpler instruments and the ability to upgrade existing interferometers. Furthermore, it allows absolute measurement of distance, including radius of curvature of lenses in a single setup with possibility of improving the throughput and removing some modes of failure.

Paper Details

Date Published: 16 October 2017
PDF: 7 pages
Proc. SPIE 10448, Optifab 2017, 104481C (16 October 2017); doi: 10.1117/12.2279811
Show Author Affiliations
Chase Salsbury, Äpre Instruments, LLC (United States)
College of Optical Sciences, The Univ. of Arizona (United States)
Artur G. Olszak, Äpre Instruments, LLC (United States)


Published in SPIE Proceedings Vol. 10448:
Optifab 2017
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

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