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Proceedings Paper

Cheap and fast measuring roughness on big surfaces with an imprint method
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Paper Abstract

Roughness, shape and structure of a surface offer information on the state, shape and surface characteristics of a component. Particularly the roughness of the surface dictates the subsequent polishing of the optical surface. The roughness is usually measured by a white light interferometer, which is limited by the size of the components. Using a moulding method of surfaces that are difficult to reach, an imprint is taken and analysed regarding to roughness and structure. This moulding compound method is successfully used in dental technology. In optical production, the moulding compound method is advantageous in roughness determination in inaccessible spots or on large components (astrological optics).

The "replica method" has been around in metal analysis and processing. Film is used in order to take an impression of a surface. Then, it is analysed for structures. In optical production, compound moulding seems advantageous in roughness determination in inaccessible spots or on large components (astrological optics). In preliminary trials, different glass samples with different roughness levels were manufactured. Imprints were taken from these samples (based on DIN 54150 „Abdruckverfahren für die Oberflächenprüfung"). The objective of these feasibility tests was to determine the limits of this method (smallest roughness determinable / highest roughness). The roughness of the imprint was compared with the roughness of the glass samples. By comparing the results, the uncertainty of the measuring method was determined.

The spectrum for the trials ranged from rough grind (0.8 μm rms), over finishing grind (0.6 μm rms) to polishing (0.1 μm rms).

Paper Details

Date Published:
PDF
Proc. SPIE 10448, Optifab 2017, ; doi: 10.1117/12.2279671
Show Author Affiliations
Christian Schopf, Hochschule Deggendorf Technologiecampus Teisnach (Germany)
Rolf Rascher, Hochschule Deggendorf Technologiecampus Teisnach (Germany)
Johannes Liebl, Hochschule Deggendorf Technologiecampus Teisnach (Germany)


Published in SPIE Proceedings Vol. 10448:
Optifab 2017
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

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