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Proceedings Paper

Surface defect detection using novel histogram distance based multiple template anomalies detection algorithm
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Proc. SPIE 10423, Sensors, Systems, and Next-Generation Satellites XXI, ; doi: 10.1117/12.2279573
Show Author Affiliations
Chow Jeng Wong, Univ. Sains Malaysia (Malaysia)
Kok Chooi Tan, Univ. Sains Malaysia (Malaysia)


Published in SPIE Proceedings Vol. 10423:
Sensors, Systems, and Next-Generation Satellites XXI
Steven P. Neeck; Jean-Loup Bézy; Toshiyoshi Kimura, Editor(s)

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