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Proceedings Paper

Using MTF to evaluate optical systems employing unusual optics
Author(s): Roy L. Youman
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Paper Abstract

With the proliferation of aspheric and unusual optical surfaces in many optical systems, manufacturers are finding that conventional optical metrology methods are no longer suitable when characterizing these systems. For example, monochromatic interferometric measurements of individual components are being replaced by methods which determine system performance by analyzing the actual image produced by the optical system. This presentation will cover MTF and how it is used to characterize optical assemblies and systems employing unusual optical components.

Paper Details

Date Published: 1 December 1995
PDF: 5 pages
Proc. SPIE 2600, Design, Fabrication, and Applications of Precision Plastic Optics, (1 December 1995); doi: 10.1117/12.227919
Show Author Affiliations
Roy L. Youman, Optikos Corp. (United States)

Published in SPIE Proceedings Vol. 2600:
Design, Fabrication, and Applications of Precision Plastic Optics
Alex Ning; Raymond T. Hebert, Editor(s)

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