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Single-particle imaging for biosensor applications
Author(s): Mustafa Yorulmaz; Cagatay Isil; Elif Seymour; Celalettin Yurdakul; Berkan Solmaz; Aykut Koc; M. Selim Ünlü
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Paper Abstract

Current state-of-the-art technology for in-vitro diagnostics employ laboratory tests such as ELISA that consists of a multi-step test procedure and give results in analog format. Results of these tests are interpreted by the color change in a set of diluted samples in a multi-well plate. However, detection of the minute changes in the color poses challenges and can lead to false interpretations. Instead, a technique that allows individual counting of specific binding events would be useful to overcome such challenges. Digital imaging has been applied recently for diagnostics applications. SPR is one of the techniques allowing quantitative measurements. However, the limit of detection in this technique is on the order of nM. The current required detection limit, which is already achieved with the analog techniques, is around pM. Optical techniques that are simple to implement and can offer better sensitivities have great potential to be used in medical diagnostics. Interference Microscopy is one of the tools that have been investigated over years in optics field. More of the studies have been performed in confocal geometry and each individual nanoparticle was observed separately. Here, we achieve wide-field imaging of individual nanoparticles in a large field-of-view (~166 μm × 250 μm) on a micro-array based sensor chip in fraction of a second. We tested the sensitivity of our technique on dielectric nanoparticles because they exhibit optical properties similar to viruses and cells. We can detect non-resonant dielectric polystyrene nanoparticles of 100 nm. Moreover, we perform post-processing applications to further enhance visibility.

Paper Details

Date Published: 6 October 2017
PDF: 8 pages
Proc. SPIE 10438, Emerging Imaging and Sensing Technologies for Security and Defence II, 104380I (6 October 2017); doi: 10.1117/12.2279005
Show Author Affiliations
Mustafa Yorulmaz, ASELSAN A.S. (Turkey)
Cagatay Isil, ASELSAN A.S. (Turkey)
Elif Seymour, ASELSAN A.S. (Turkey)
Celalettin Yurdakul, Boston Univ. (United States)
Berkan Solmaz, ASELSAN A.S. (Turkey)
Aykut Koc, ASELSAN A.S. (Turkey)
M. Selim Ünlü, Boston Univ. (United States)


Published in SPIE Proceedings Vol. 10438:
Emerging Imaging and Sensing Technologies for Security and Defence II
Keith L. Lewis; Richard C. Hollins; Gerald S. Buller; Robert A. Lamb, Editor(s)

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