Share Email Print
cover

Proceedings Paper • new

A high-speed full-field profilometry with coded laser strips projection
Author(s): Guanliang Zhang; Xiang Zhou; Rui Jin; Changda Xu; Dong Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Line structure light measurement needs accurate mechanical movement device and high -frame-rate camera, which is difficult to realize. We propose a high-speed full-field profilometry to solve these difficult ies, using coded laser strips projected by a MEMS scanning mirror. The mirror could take place of the mechanical movement device with its high speed and accurate. Besides, a method with gray code and color code is used to decrease the frames number of projection, retaining the advantage of line structure light measurement. In the experiment, we use a laser MEMS scanner and two color cameras. The laser MEMS scanner projects coded stripes, with two color cameras collecting the modulated pattern on the measured object. The color cameras compose a stereo vision system so that the three-dimensional data is reconstructed according to triangulation.

Paper Details

Date Published: 26 June 2017
PDF: 6 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294W (26 June 2017); doi: 10.1117/12.2278907
Show Author Affiliations
Guanliang Zhang, Xi'an Jiaotong Univ. (China)
Xiang Zhou, Xi'an Jiaotong Univ. (China)
Rui Jin, Xi'an Jiaotong Univ. (China)
Changda Xu, Xi'an Jiaotong Univ. (China)
Dong Li, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top