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Proceedings Paper

Detection of terahertz radiation using submicron field effect transistors and their use for inspection applications
Author(s): J. A. Delgado Notario; E. Javadi; J. E. Velázquez; E. Diez; Y. M. Meziani; K. Fobelets
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Paper Abstract

We investigated room temperature detection of terahertz radiation by using two different types of transistors (Strained Silicon Modulation field effect transistor, GaAs PHEMT). Experimental results show a good level of response under excitation at 0.3 THz. Competitive performance parameters were obtained (NEP and responsivity) in comparison with other detectors. Enhancement of the photoresponse signal by imposing a dc drain-to-source current (Ids) was observed experimentally. Inspection of hidden objects by using those devices within a terahertz imaging setup was demonstrated at 300 GHz and a better image was obtained under Ids.

Paper Details

Date Published: 6 October 2017
PDF: 6 pages
Proc. SPIE 10439, Millimetre Wave and Terahertz Sensors and Technology X, 1043907 (6 October 2017); doi: 10.1117/12.2278208
Show Author Affiliations
J. A. Delgado Notario, Salamanca Univ. (Spain)
E. Javadi, Univ. of Tehran (Iran, Islamic Republic of)
J. E. Velázquez, Salamanca Univ. (Spain)
E. Diez, Salamanca Univ. (Spain)
Y. M. Meziani, Salamanca Univ. (Spain)
K. Fobelets, Imperial College London (United Kingdom)


Published in SPIE Proceedings Vol. 10439:
Millimetre Wave and Terahertz Sensors and Technology X
Neil A. Salmon; Sherif Sayed Ahmed, Editor(s)

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