Share Email Print
cover

Proceedings Paper

THz metrology for active electronic devices: state of the art and challenges
Author(s): Mira Naftaly
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The area of terahertz science and applications has grown dramatically in the last 30 years. Instrumental platforms for THz measurements have also proliferated, and now include laser-based, electronic, opto-electronic, and microwave photonics devices. As the field matured, metrology and standardization have gained focused attention, resulting in an increasing number of publications and a book devoted to the subject. However, these have been primarily focused on photonic-based free-space techniques and their particular demands and issues. This paper presents a brief review of metrology requirements for active THz electronic devices, the available instrumentation, state of the art, and challenges.

Paper Details

Date Published: 22 August 2017
PDF: 9 pages
Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532Z (22 August 2017); doi: 10.1117/12.2276354
Show Author Affiliations
Mira Naftaly, National Physical Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 10453:
Third International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

© SPIE. Terms of Use
Back to Top