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Proceedings Paper

THz metrology for active electronic devices: state of the art and challenges
Author(s): Mira Naftaly
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Paper Abstract

The area of terahertz science and applications has grown dramatically in the last 30 years. Instrumental platforms for THz measurements have also proliferated, and now include laser-based, electronic, opto-electronic, and microwave photonics devices. As the field matured, metrology and standardization have gained focused attention, resulting in an increasing number of publications and a book devoted to the subject. However, these have been primarily focused on photonic-based free-space techniques and their particular demands and issues. This paper presents a brief review of metrology requirements for active THz electronic devices, the available instrumentation, state of the art, and challenges.

Paper Details

Date Published: 22 August 2017
PDF: 9 pages
Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532Z (22 August 2017); doi: 10.1117/12.2276354
Show Author Affiliations
Mira Naftaly, National Physical Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 10453:
Third International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

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