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Proceedings Paper

3D mapping grain morphology and grain orientations by laboratory diffraction contrast tomography
Author(s): Christian Holzner; Nicolas Gueninchault; Florian Bachmann; Hrishikesh Bale; Leah Lavery; Erik Lauridsen
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Proc. SPIE 10391, Developments in X-Ray Tomography XI, 103910D; doi: 10.1117/12.2275919
Show Author Affiliations
Christian Holzner, Carl Zeiss X-ray Microscopy, Inc. (United States)
Nicolas Gueninchault, Xnovo Technology ApS (Denmark)
Florian Bachmann, Xnovo Technology ApS (Denmark)
Hrishikesh Bale, Carl Zeiss X-ray Microscopy, Inc. (United States)
Leah Lavery, Carl Zeiss X-ray Microscopy, Inc. (United States)
Erik Lauridsen, Xnovo Technology ApS (Denmark)


Published in SPIE Proceedings Vol. 10391:
Developments in X-Ray Tomography XI
Bert Müller; Ge Wang, Editor(s)

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