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Proceedings Paper

Application of instrument transfer function to a fringe projection system for measuring rough surfaces
Author(s): Bin Zhang; Angela Davies; John Ziegert; Christopher Evans
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Paper Abstract

When fringe projection profilometry is used for measuring rough/textured surfaces, the fidelity of the measurement is subject to the spatial frequency response. The instrument transfer function (ITF) is one appealing approach to characterize this property. The foundation of ITF analysis is based on the linear theory; only linear systems are appropriate for ITF analysis. A fringe projection system is intrinsically nonlinear, but it can be approximated as a linear system when certain conditions are met. Here we investigate the linear conditions of a custom fringe projection system designed for an additive manufacturing application. The applicability of ITF is discussed through mathematical analysis and simulations.

Paper Details

Date Published: 23 August 2017
PDF: 13 pages
Proc. SPIE 10373, Applied Optical Metrology II, 103730S (23 August 2017); doi: 10.1117/12.2275892
Show Author Affiliations
Bin Zhang, The Univ. of North Carolina at Charlotte (United States)
Angela Davies, The Univ. of North Carolina at Charlotte (United States)
John Ziegert, The Univ. of North Carolina at Charlotte (United States)
Christopher Evans, The Univ. of North Carolina at Charlotte (United States)


Published in SPIE Proceedings Vol. 10373:
Applied Optical Metrology II
Erik Novak; James D. Trolinger, Editor(s)

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