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Proceedings Paper

Integrated control system environment for high-throughput tomography
Author(s): I. Khokhriakov; L. Lottermoser; Michele Caselle; Matthias Vogelgesang; Andreas Kopmann; Silke Lautner; F. Beckmann
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Paper Abstract

The extensive progress in hardware in recent years makes it now possible to develop nearly real time control system for tomography experiments. Such system can perform all the routines that are necessary for the experiment and provide real time feedback to the user. This feedback can be used for instant monitoring and/or for real time reconstruction. The initial design and implementation of such system was presented in the SPIE publication in 2014 [1]. In this paper an update to the system is presented. The paper will cover the following 4 topics. The first topic simply gives an overview of the system. The second topic presents the way how we integrate different software components to achieve simplicity and flexibility. As it is still in research and design phase we need a possibility to easily adjust the system to our needs introducing new components or removing old ones. The third topic presents a hardware driven tomography experiment design implemented at one of our beamlines. The basic idea is that a hardware signal is sent to the instrument hardware (camera, shutter etc). This signal is emitted by the controller of the sample axis which defines the moment when the system is ready to capture the next image i.e. next rotation angle. Finally as our software is in a constant process of evaluation a continuous integration process was implemented to reduce the time cost of redeployment and configuration of new versions.

Paper Details

Date Published:
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Proc. SPIE 10391, Developments in X-Ray Tomography XI, 103911H; doi: 10.1117/12.2275863
Show Author Affiliations
I. Khokhriakov, Helmholtz-Zentrum Geesthacht (Germany)
L. Lottermoser, Helmholtz-Zentrum Geesthacht (Germany)
Michele Caselle, Institute for Data Processing and Electronics/Karlsruhe Institute of Technology (Germany)
Matthias Vogelgesang, Institute for Data Processing and Electronics/Karlsruhe Institute of Technology (Germany)
Andreas Kopmann, Institute for Data Processing and Electronics/Karlsruhe Institute of Technology (Germany)
Silke Lautner, Eberswalde University for Sustainable Development, Faculty of Wood Engineering (Germany)
F. Beckmann, Helmholtz-Zentrum Geesthacht (Germany)


Published in SPIE Proceedings Vol. 10391:
Developments in X-Ray Tomography XI
Bert Müller; Ge Wang, Editor(s)

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