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Proceedings Paper

Characterization of multilayer coated replicated Wolter optics for imaging x-ray emission from pulsed power
Author(s): A. Ames; D. Ampleford; C. Bourdon; R. Bruni; K. Kilaru; B. Kozioziemski; M. Pivovaroff; B. Ramsey; S. Romaine; J. Vogel; C. Walton; M. Wu
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Paper Abstract

We have developed a process for indirectly coating arbitrarily small diameter electroformed nickel replicated optics with multilayers to increase their response at high energy (i.e. >10 keV). The ability to fabricate small diameter multilayer coated full shell Wolter X-ray optics with narrow bandpass opens the door to several applications within astronomy and also provides a path for cross-fertilization to other fields. We report on the characterization and evaluation of the first two prototype X-ray Wolter optics to be delivered to the Z Pulsed Power Facility at Sandia National Laboratories. The intent is to develop and field several optics as part of an imaging system with targeted spectral ranges.

Paper Details

Date Published: 29 August 2017
PDF: 6 pages
Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 103991X (29 August 2017); doi: 10.1117/12.2275721
Show Author Affiliations
A. Ames, Harvard-Smithsonian Ctr. for Astrophysics (United States)
D. Ampleford, Sandia National Labs. (United States)
C. Bourdon, Sandia National Labs. (United States)
R. Bruni, Harvard-Smithsonian Ctr. for Astrophysics (United States)
K. Kilaru, Universities Space Research Association (United States)
B. Kozioziemski, Lawrence Livermore National Lab. (United States)
M. Pivovaroff, Lawrence Livermore National Lab. (United States)
B. Ramsey, National Space Sciences and Technology Ctr. (United States)
S. Romaine, Harvard-Smithsonian Ctr. for Astrophysics (United States)
J. Vogel, Lawrence Livermore National Lab. (United States)
C. Walton, Lawrence Livermore National Lab. (United States)
M. Wu, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 10399:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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