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A scanning approach using a binary grid pattern for 3D shape measurements
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Paper Abstract

A scanning pattern projection technique for 3D shape measurements is proposed. A binary grid pattern is employed as the projected pattern. The limited depth-of-focus of the pattern projection system makes the surface on the focused area can be clearly observed. Thus, a 2D contour of the inspected surface addressed by the in-focused fringes was obtained. By assembling the surface contours with their corresponding depths, the 3D shape of the object cab retrieved.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820N (23 August 2017); doi: 10.1117/12.2275327
Show Author Affiliations
Nai-Jen Cheng, National Kaohsiung Univ. of Applied Sciences (Taiwan)
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 10382:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
Shizhuo Yin; Ruyan Guo, Editor(s)

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