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Proceedings Paper

One shot profile measurements using a binary-encoded pattern
Author(s): Wei-Hung Su; Sih-Yue Chen
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Paper Abstract

A one-shot profilometry for surfaces with color or reflectivity discontinuties is presented. It uses binary-encoded pattern to illuminate the inspected object and a monochromatic camera to observe the deformed fringes at another view angle. The encoded pattern provides additional to identify the fringe order. For spatially isolated objects or surfaces with large depth discontinuities, unwrapping can be identified without ambiguity. Even though the surface color or reflectivity varies rapidly with position, it distinguishes the fringe order as well.

Paper Details

Date Published: 23 August 2017
PDF: 6 pages
Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820T (23 August 2017); doi: 10.1117/12.2275322
Show Author Affiliations
Wei-Hung Su, National Sun Yat-sen Univ. (Taiwan)
Sih-Yue Chen, National Sun Yat-sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 10382:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
Shizhuo Yin; Ruyan Guo, Editor(s)

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