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Proceedings Paper

Investigation of a high-sensitivity near-infrared-ray computed tomography scanner
Author(s): Eiichi Sato; Yasuyuki Oda; Sohei Yoshida; Satoshi Yamaguchi; Yuichi Sato; Osahiko Hagiwara; Tomotaka Ishii; Hiroshi Matsukiyo; Toshiyuki Enomoto; Manabu Watanabe; Shinya Kusachi
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Paper Abstract

In the near-infrared-ray computed tomography (NIR-CT) scanner, NIR rays are produced from a light-emitting diode (LED) and detected using a phototransistor (PT) and an infrared filter. The LED-peak wavelength is 850 nm, and 850- nm-peak NIRs are detected using the filtrated PD. The photocurrents flowing through the PT are converted into voltages using an emitter-follower circuit, and the output voltages are sent to a personal computer through an analog-digital converter. The NIR projection curves for tomography are obtained by repeated translations and rotations of the object, and the translating is conducted in both directions of its movement. The 850-nm NIRs easily penetrated living bodies, and the NIR-CT was performed with changes in the sensitivity at relative sensitivities of 1 and 21.

Paper Details

Date Published: 7 September 2017
PDF: 6 pages
Proc. SPIE 10393, Radiation Detectors in Medicine, Industry, and National Security XVIII, 103930U (7 September 2017); doi: 10.1117/12.2275290
Show Author Affiliations
Eiichi Sato, Iwate Medical Univ. (Japan)
Yasuyuki Oda, Iwate Medical Univ. (Japan)
Sohei Yoshida, Iwate Medical Univ. (Japan)
Satoshi Yamaguchi, Iwate Medical Univ. (Japan)
Yuichi Sato, Iwate Medical Univ. Hospital (Japan)
Osahiko Hagiwara, Iwate Medical Univ. (Japan)
Tomotaka Ishii, Toho Univ. Ohashi Medical Ctr. (Japan)
Hiroshi Matsukiyo, Toho Univ. Ohashi Medical Ctr. (Japan)
Toshiyuki Enomoto, Toho Univ. Ohashi Medical Ctr. (Japan)
Manabu Watanabe, Toho Univ. Ohashi Medical Ctr. (Japan)
Shinya Kusachi, Toho Univ. Ohashi Medical Ctr. (Japan)


Published in SPIE Proceedings Vol. 10393:
Radiation Detectors in Medicine, Industry, and National Security XVIII
Gary P. Grim; Lars R. Furenlid; H. Bradford Barber, Editor(s)

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